Electromagnetics Literature Guide

This page groups sources by domain and source type so that foundational literature, modern reviews, representative experiments, institutional resources, and metrology sources remain easy to locate.

General electromagnetics

Open university and institutional resources

• MIT OpenCourseWare — Electromagnetics and Applications — fields through communication systems, antennas, sensors, motors and optics.
• MIT OpenCourseWare — graduate Electromagnetics — advanced EM with demonstrations and computational material.

Radar

• MIT Lincoln Laboratory — Introduction to Radar Systems — open lecture series covering radar-system concepts and technologies.

Quantum optics and atom–field interaction

• M. Fleischhauer, A. Imamoglu and J. P. Marangos, “Electromagnetically induced transparency,” Rev. Mod. Phys. 77, 633 (2005). https://doi.org/10.1103/RevModPhys.77.633

Rydberg atoms and RF sensing

• J. A. Sedlacek et al., “Microwave electrometry with Rydberg atoms in a vapour cell using bright atomic resonances,” Nature Physics 8, 819–824 (2012). https://doi.org/10.1038/nphys2423
• C. L. Holloway et al., work on atom-based RF electric-field metrology and Rydberg EIT/Autler–Townes sensing.
• NIST Electromagnetic Fields Group resources: https://www.nist.gov/ctl/rf-technology-division/electromagnetic-fields-group

Atomic magnetometry

• D. Budker and M. Romalis, “Optical Magnetometry,” Nature Physics 3, 227–234 (2007). https://doi.org/10.1038/nphys566
• W. Happer, “Optical Pumping,” Rev. Mod. Phys. 44, 169 (1972). https://doi.org/10.1103/RevModPhys.44.169
• I. K. Kominis et al., “A subfemtotesla multichannel atomic magnetometer,” Nature 422, 596–599 (2003). https://doi.org/10.1038/nature01484

Radiation and particle detectors

• W. Shockley, “Currents to Conductors Induced by a Moving Point Charge,” J. Appl. Phys. 9, 635–636 (1938).
• S. Ramo, “Currents Induced by Electron Motion,” Proc. IRE 27, 584–585 (1939).

Spacecraft, EMC and metrology

• NASA JSC — EMI/EMC — spacecraft EMC engineering, simulation and test.
• NIST — Electromagnetic Field Strength Metrology — SI-linked field-strength calibration and EMC measurement science.
• NIST Electromagnetic Fields Group — antenna, radiated-field and quantum-based field metrology.

Presentation companion

The Presentations & Lectures page contains visual teaching material from MIT, CERN, NASA and universities.